Comprehensive R&D Capabilities in Optics, Mechanics, Electronics, Computing, and Software
Multiple Imaging Techniques to Meet Diverse Inspection Requirements
Multi-view Photometric Stereo for the Reconstruction of Surface Normals, Reflectance, and Pseudo-Height Maps
Low angle light source
Medium angle light source
High angle light source
Capable of sequential image acquisition with varied lighting angles and exposures for a single object, making it suitable for inspecting challenging surfaces like transparent and reflective materials.
bright field
Dark Field (Horizontal)
Dark Field (Vertical)
Back lighting
Support multiple spectral images such as R, G, B, IR, UV, etc. for image true color synthesis
RGB1 (solar photovoltaic silicon wafer)
RGB2 (solar photovoltaic silicon wafer)
Hybrid (solar photovoltaic silicon wafers)
RGB1 (battery)
RGB2 (battery)
Texture information: 2.5D, 2D data Morphological information: point cloud, depth image data
3D profilometer scanning point cloud stitching
3D&2D point cloud fusion rendering
Demonstrates robust detection performance in challenging scenarios characterized by low contrast, high reflectivity, and moderate surface variations. Detection accuracy is further enhanced by leveraging image feature fusion to achieve long-short term memory.
